$15.00
The characterization of surface defects on thin metallic wires is very important for the industrial applications of these wires. The physical dimensions of the surface defects (holes and scratches) presented by several thin steel wires of different diameters have been systematically measured using an Atomic Force Microscope.
The characterization of surface defects on thin metallic wires is very important for the industrial applications of these wires. The physical dimensions of the surface defects (holes and scratches) presented by several thin steel wires of different diameters have been systematically measured using an Atomic Force Microscope.
| Author(s) | L. M. Sanchez-Brea, P. Siegmann and E. Bernabeu, Universidad Complutense de Madrid, Spain. |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 69th Annual Convention, Atlanta, GA USA |
| Year | 1999 |
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