Description
Copper and enamel come together in magnet wire by means of the enameling process and conform to a composite of a wide range of applications in bobbins, motors and transformers. The copper and enamel characterization by traditional techniques based on their physical properties seems not to be enough to forecast the behavior of both materials in the process of magnet wire manufacturing. This paper examines the use of the Atomic Force Microscope (AFM) and the Scanning Electron Microscope (SEM) in the analysis of copper and enamel respectively.