$15.00
In this investigation, Atomic Force Microscopy has been applied to study the nano-scale lamellar microstructure of heavily deformed (e=4) pearlitic steel wire used in automotive applications. In combination with high-resolution SEM and mechanical testing, the influence of the process parameters on radial gradients in the wire properties has been characterized.
In this investigation, Atomic Force Microscopy has been applied to study the nano-scale lamellar microstructure of heavily deformed (e=4) pearlitic steel wire used in automotive applications. In combination with high-resolution SEM and mechanical testing, the influence of the process parameters on radial gradients in the wire properties has been characterized.
| Author(s) | Hilde Delrue and Eric Bruneel, N.V. Bekaert S.A., and Jan Van Humbeeck and Etienne Aernoudt, Catholic University Leuven, Belgium |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 70th Annual Convention, Nashville, TN USA. Paper published in WJI, October 2001, pg. 92. |
| Year | 2000 |
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