$15.00
This paper describes the merging of the eddy current and infrared optical tests to simultaneously test insulated wire for flaws in both the wire and the insulation. Both methods test at speeds from 5 fpm to more than 5000 fpm; additional outputs are used to mark flaws at suitable speeds, classify flaws by type, and signal the operator when identifying flaws.
This paper describes the merging of the eddy current and infrared optical tests to simultaneously test insulated wire for flaws in both the wire and the insulation. Both methods test at speeds from 5 fpm to more than 5000 fpm; additional outputs are used to mark flaws at suitable speeds, classify flaws by type, and signal the operator when identifying flaws.
| Author(s) | Patrick W. Sansieri, Odyssey Technology Corp., USA |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 70th Annual Convention, Nashville, TN USA |
| Year | 2000 |
The Wire Association International, Inc.
71 Bradley Road, Suite 9
Madison, CT 06443-2662
The Wire Association International (WAI), Inc., founded in 1930, is a worldwide technical society for wire and cable industry professionals. Based in Madison, Connecticut, USA, WAI collects and shares technical, manufacturing, and general business information to the ferrous, nonferrous, electrical, fiber optic, and fastener segments of the wire and cable industry.
Copyright © 2025 The Wire Association International, Inc. All Rights Reserved
