$15.00
The authors present a new optical method to detect the surface defects (scratches, holes and protuberances) of thin metallic wires based on geometrical conical refraction. When the wire is illuminated by a laser beam with oblique incidence with respect to the wire axis.
The authors present a new optical method to detect the surface defects (scratches, holes and protuberances) of thin metallic wires based on geometrical conical refraction. When the wire is illuminated by a laser beam with oblique incidence with respect to the wire axis.
| Author(s) | L. M. Sanchez-Brea, P. Siegmann and E. Bernabeu, Universidad Complutense de Madrid, Spain; and M.A. Rebollo, F. Perez-Quintian and C.A. Raffo, Universidad de Buenos Aires, Argentina. |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 69th Annual Convention, Atlanta, GA USA. Paper published in Wire Journal International, August 2000, pg. 124. |
| Year | 1999 |
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