$15.00
Studies of models and measurement techniques for industrial application of wires are required, especially if the resolution is less than one micron. Each system of measurement has its conditions of calibration to minimize systematic errors. The authors have compared three measurement techniques (diffractometry, interferometry and mechanic).
Studies of models and measurement techniques for industrial application of wires are required, especially if the resolution is less than one micron. Each system of measurement has its conditions of calibration to minimize systematic errors. The authors have compared three measurement techniques (diffractometry, interferometry and mechanic).
| Author(s) | I. Serroukh, J.C. Martinez-Anton and E. Bernabeu, Universidad Complutense de Madrid, Spain |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 69th Annual Convention, Atlanta, GA USA. Paper published in Wire Journal International, March 2000, pg. 116. |
| Year | 1999 |
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