Grain boundary analysis of an Al-Cu 4% alloy by atomic force microscopy

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In the wire industry it is very important to use new techniques to characterize the products that they process. Material’s grain boundary influences the mechanical and electrical properties of their final products. This study is the beginning of a series of works that we will perform to relate the electrical conductivity and mechanical strength with the size and tunneling current of the grain boundary.

Description

In the wire industry it is very important to use new techniques to characterize the products that they process. Material’s grain boundary influences the mechanical and electrical properties of their final products. This study is the beginning of a series of works that we will perform to relate the electrical conductivity and mechanical strength with the size and tunneling current of the grain boundary.

Additional information

Author(s)

Enrique Manuel López Cuéllar, Carlos Guerrero, Edgar Reyes and Ubaldo Ortiz, Universidad Autónoma de Nuevo León, Mexico.

Publication/Event/Pages

Paper presented at WAI 68th Annual Convention, Cleveland, OH USA. Paper published in Wire Journal International, Jan. 1999, pg. 102.

Year

1998