In-process die wear diagnosis by contact resistance measurement

$15.00

Measurement of the electrical contact resistance between the wire and die is useful in in-process monitoring of failures in tungston carbide dies. So far the resistance fall below a pre-selected threshold level has been used to perform alarm or to trip the drawing machine. Signal processing of the resistance measurement is suggested to enhance the monitoring for prediction of worn out dies and for supporting adaptive control of drawing speed.

Description

Measurement of the electrical contact resistance between the wire and die is useful in in-process monitoring of failures in tungston carbide dies. So far the resistance fall below a pre-selected threshold level has been used to perform alarm or to trip the drawing machine. Signal processing of the resistance measurement is suggested to enhance the monitoring for prediction of worn out dies and for supporting adaptive control of drawing speed.

Additional information

Author(s)

Bruno Nilsson, The Royal Institute of Technology, Sweden.

Publication/Event/Pages

Paper presented at WAI 63rd Annual Convention, Atlanta, GA USA. Paper published in Wire Journal International, June 1994, pg. 76.

Year

1993