$15.00
Failure processes in carbon/sulfur segregated rod and wire were investigated. Internal V-crack bursts (cupping) are associated with grain boundary carbide films; initiation site is usually a triple point. Reduced interface cohesion caused by sulfur segregation results in embrittlement at grain boundaries.
Failure processes in carbon/sulfur segregated rod and wire were investigated. Internal V-crack bursts (cupping) are associated with grain boundary carbide films; initiation site is usually a triple point. Reduced interface cohesion caused by sulfur segregation results in embrittlement at grain boundaries.
| Author(s) | Edwards, L.University of Oxford, Miller, M.K.Williams, P.R.Smith, G.D.W. |
|---|---|
| Publication/Event/Pages | Wire Journal12(12): 68-72 1979, Paper presented at WAI 2nd European Regional Meeting, Lyon, France |
| Year | 1979 |
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