$15.00
Various approaches to on-line measurement of insulating thickness will be analyzed. Advantages and disadvantages of different measuring techniques are described. Comparisons are followed by explanations on closed loop control for wall thickness and/or outer diameter. Aspects of acquisition of SPC data and their analysis will conclude the presentation.
Various approaches to on-line measurement of insulating thickness will be analyzed. Advantages and disadvantages of different measuring techniques are described. Comparisons are followed by explanations on closed loop control for wall thickness and/or outer diameter. Aspects of acquisition of SPC data and their analysis will conclude the presentation.
| Author(s) | Matthew Brunner and Hubert A. Merki, Zumbach, Switzerland/Zumbach, U.S.A. |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 57th Annual Convention, Atlanta, GA USA |
| Year | 1987 |
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