$15.00
A study of the origin of leak-producing surface defects in Remreed contacts is presented. Samples of Remendur rod and wire at successive processing stages were examined by optical and scanning electron microscopy. Optical cross-sections and SEM surface photographs of various stages are included.
A study of the origin of leak-producing surface defects in Remreed contacts is presented. Samples of Remendur rod and wire at successive processing stages were examined by optical and scanning electron microscopy. Optical cross-sections and SEM surface photographs of various stages are included.
| Author(s) | Pinnel, M.R.Bell Telephone Labs Inc., Bennett, J.E.Olsen, K.M. |
|---|---|
| Publication/Event/Pages | Wire Journal9(4): 73-79 1976 |
| Year | 1976 |
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