$15.00
The author describes recent advances in the use of rotating eddy current probe assemblies for the in-line inspection of HCS wire and rod. Digital processing at high rotational speeds permits real-time analysis and categorization of seam type defects by their location, length and depth. Developments in probe technology and automatic gap compensation significantly enhance performance.
The author describes recent advances in the use of rotating eddy current probe assemblies for the in-line inspection of HCS wire and rod. Digital processing at high rotational speeds permits real-time analysis and categorization of seam type defects by their location, length and depth. Developments in probe technology and automatic gap compensation significantly enhance performance.
| Author(s) | Brian Roberts, Advanced Kiffer Systems, USA |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 69th Annual Convention, Atlanta, GA USA |
| Year | 1999 |
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