Description
Effective instrumentation and SPC analysis join to document and optimize coated wire extrusion control
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Effective instrumentation and SPC analysis join to document and optimize coated wire extrusion control
Effective instrumentation and SPC analysis join to document and optimize coated wire extrusion control
Author(s) | Kurt Goszyk, Contrologic Inc., and Wayne Reed Markel Corp., USA |
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Publication/Event/Pages | Paper presented at WAI 60 Annual Convention, Boston, MA USA. Paper published in Wire Journal International, April 1991, pg. 52. |
Year | 1990 |