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Impurity fingerprints of electrorefined and electrowon copper cathodes are described. The occurrences and effects of common trace element impurities are reviewed. Trends and possibilities are discussed that will likely evolve in the next decade or two of copper recovery that could have significant beneficial impact on cathode purity.
Impurity fingerprints of electrorefined and electrowon copper cathodes are described. The occurrences and effects of common trace element impurities are reviewed. Trends and possibilities are discussed that will likely evolve in the next decade or two of copper recovery that could have significant beneficial impact on cathode purity.
| Author(s) | Sharon K. Young, Versitech, Inc., USA. |
|---|---|
| Publication/Event/Pages | Paper presented at WAI 69th Annual Convention, Atlanta, GA USA. Paper published in Wire Journal International, July 2000, pg. 98. |
| Year | 1999 |
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