$15.00
The theory and process of X-ray diffraction are described and its use in analyzing metal is discussed. This method, alone and in conjunction with fluorescence analysis, can be invaluable in wire plants for quality control of incoming raw material and for assessing the effects of wiredrawing and associated processes on the physical characteristics of wire.
The theory and process of X-ray diffraction are described and its use in analyzing metal is discussed. This method, alone and in conjunction with fluorescence analysis, can be invaluable in wire plants for quality control of incoming raw material and for assessing the effects of wiredrawing and associated processes on the physical characteristics of wire.
| Author(s) | Buhler, J., North American *Phillips Co. Inc. |
|---|---|
| Publication/Event/Pages | Wire & Wire Products27(6): 570-573 1952 |
| Year | 1952 |
The Wire Association International, Inc.
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The Wire Association International (WAI), Inc., founded in 1930, is a worldwide technical society for wire and cable industry professionals. Based in Madison, Connecticut, USA, WAI collects and shares technical, manufacturing, and general business information to the ferrous, nonferrous, electrical, fiber optic, and fastener segments of the wire and cable industry.
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