Description
A concerted R & D effort has led to the creation of an X-ray scanning system that offers greater accuracy and control, rsulting in substantial raw material savings.
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A concerted R & D effort has led to the creation of an X-ray scanning system that offers greater accuracy and control, rsulting in substantial raw material savings.
A concerted R & D effort has led to the creation of an X-ray scanning system that offers greater accuracy and control, rsulting in substantial raw material savings.
Author(s) | Harry Prunk, Sikora AG, Germany |
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Publication/Event/Pages | Paper presented at WAI International Technical Conference, Montreal, Quebec, Canada. Paper published in Wire Journal International, Jan. 2004, pg. 67. |
Year | 2002 |